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Derivation and Explanation of Equation 3.7
Why would one expect this formula to work? The underlying principle
is the time-honoured one of making two measurements, in which the
systematic error is of the same magnitude, but in opposite senses,
then taking an average of the two measurements, to obtain a result
free of systematic error. However, because the systematic errors
under consideration here are multiplicative, rather than additive,
``average'' indicates geometric mean, rather than arithmetic mean.
The application of this principle in the present case will now be
examined in greater detail.
Let
be the sensitivity (quantum efficiency) of detector
.
The two sources of multiplicative systematic error mentioned above can
be defined as conditions where
, and where
, where the misalignment
is as defined in
figure 3.3. The measured electron arrival rate at detector
, with incident polarization direction
,
, is
 |
(3.8) |
where
is the actual rate at which electrons arrive at the
detector.
Let
be the solid angle subtended by detector
at the point
where the electron beam strikes the thorium foil. The scattering
probability per unit solid angle in the region of detector
is
(equation 3.4)
for polarization
direction
, and
for
polarization direction
, and vice versa (equation
3.5) in the region of detector
, i.e., if
is the rate at
which electrons are incident on the thorium foil,
 |
(3.9) |
 |
(3.10) |
 |
(3.11) |
and
 |
(3.12) |
Therefore,
 |
(3.13) |
 |
(3.14) |
 |
(3.15) |
and
 |
(3.16) |
If
is the
cross-sectional area of a detector,
where
. Similarly,
 |
(3.18) |
Some cumbersome notation can be avoided by defining
and
.
Then
 |
(3.19) |
and
 |
(3.20) |
The polarization obtained from equation 3.7, in the absence of
random errors, is therefore,
Next: Additive Offsets
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Daniel Christopher Hatton
2004-11-30