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Spin-Polarized Electron Scattering at
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Contents
Polarized Electron Reflection Study of
Subsections
Chamber and Method
Sample Holder
Argon Ion Sputtering Gun
Electron-Beam Evaporators
Method
Procedure for Cleaning the
Surface
Growth and Measurement
Procedure for Conducting Polarized Electron Reflection Measurements on One Film
Results and Discussion
Visual Inspection of the Data
Traditional Estimation
Further Discussion and Conclusions
Why Is This Statistical Analysis Necessary?
Why Use Any Statistical Inference?
Why Write New Software for the Statistical Inference?
Statistical Inference Process
Framework of the Models
Conclusions
The Details of the Inference Method
Standard Probability Distributions
Prior Probability Distributions
The Likelihood
Posterior Probability Distribution
Parameter Estimation and Model Comparison
The Parameter Estimates
Intermediate Experiment 1
Intermediate Experiment 2
Conclusions
Suggestions for Further Work
Fine Details of the Experimental Method
Sample Placement
Procedure for Magnetizing a Sample
Single Magnetization Direction
Single Channeltron
Single Beam Energy
Single Beam Current
Auger Electron Spectrum Interpretation
Daniel Christopher Hatton 2004-11-30
Surface