Procedure for Adding Cobalt to the Sample Surface and Conducting Polarized Electron Reflection Measurements

1. The sample was placed, according to the procedure in appendix A.1, in a position that had previously been determined, by observation of the resulting film with Auger electron spectroscopy [81,82,83] (sections 5.4, B), to lead to cobalt adsorption from a commercial electron-beam evaporator (section 4.3), with respect to the translational dimensions, and $180^{\circ}$ from that position, with respect to rotation about a vertical axis.
2. The cobalt evaporator was switched on, and adjusted to give a flux monitor current $I_{mon}$ of $\sim{}30\,\mathrm{nA}$; a value of $I_{mon}$ with a quantitative precision estimate was recorded.
3. The sample was placed, according to the procedure in appendix A.1, into the position for cobalt adsorption, with respect to all degrees of freedom.
4. The shutter at the front of the evaporator was opened.
5. Cobalt was allowed to be adsorbed for a time $T$ of $\sim{}1\,\mathrm{ks}$; a value of $T$ with a precision estimate was recorded.
6. The shutter at the front of the evaporator was closed.
7. The evaporator was switched off.
8. Polarized electron reflection measurements were conducted, according to the procedure in section 4.4.3.