Both models are based on the new theory of polarized electron
reflection from a bulk sample presented in chapter
2. The use of a model intended for a bulk
sample is justified on the basis that the inelastic mean free path of
electrons, of the energies used in this experiment, is
[83,51] no more than
,
with the result that even rather thin films will appear, when examined
with an electron beam, to be bulk materials.
Therefore, when the beam current into the electron gun is
, the
rate of electron incidence on the sample is
, and the rate of
electrons leaving the sample, in the reflected beam (figure 3.1,)
is, from integration of equation 2.26,
![]() |
(5.19) |
![]() |
(5.20) |
Since the entrance hole of the polarimeter (figure 3.1) is of
finite width, it is possible that not all of the electrons in the
reflected beam will enter the polarimeter. Therefore, an acceptance
probability
is defined, so that the rate of electrons entering the
polarimeter is
. The entrance hole and grids are assumed to be
non-polarizing, with the result that the polarization of the beam
entering the polarimeter is
.
The thorium foil then scatters electrons towards the two channeltrons.
The rate of electron arrival at channeltron
will be, by equation
3.4,
| (5.21) |
| (5.22) |
|
|
The published calibration data are for electron energies, on striking
the thorium foil, of
and
, and are presented
as a function of the energy loss window
, defined by the potential
at the retarding grids (chapter 3.) The author has chosen
to include the published data for a
energy, on striking
the thorium foil, in the data set (section
5.3.4,) from which inference is to proceed, and
to characterize the thorium foil by by twelve adjustable parameters,
and
, where
runs through integers from
to
inclusive,
These fifth order Taylor expansions are an extension, to calibration data that include relatively large energy loss windows, of the spirit of the first and second order Taylor expansions in ``Use of thorium as a target in electron-spin analyzers'' [94]. The fifth order has been chosen to provide a number of adjustable parameters, in each Taylor expansion, that is the largest integer less than or equal to half the number of calibration data points, in line with MacKay's [93,90] recommendation for the number of parameters in neural network models.
Channeltron
(figure 3.2,) used in single-electron
counting mode in these experiments, has a detection efficiency
, adjusted by a time-dependent perturbation
to allow
for drift (section 5.5.) Since the speed of
the present experiments has been chosen so that the drift should not
be significant within the time-scale of measurements on a single film
thickness, each channeltron has just one
value for each film
thickness; the subscript
, as before, indexes the film thickness.
Therefore, the electron detection rate at the channeltron
, from
film thickness
, is predicted to be